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专利名称:System and Method for Information
Handling System Thermal Diagnostics
发明人:Drew Schulke,Barry Kahr,Vinod
Makhija,Adolfo Montero,Hasnain Shabbir
申请号:US11840366申请日:20070817
公开号:US20070288191A1公开日:20071213
专利附图:
摘要:Thermal subsystems of manufactured information handling systems are testedfor compliance with desired parameters by running a thermal diagnostics module in
firmware during one or more manufacturing activities performed on the informationhandling system. The thermal diagnostics module monitors and stores one or morethermal parameters detected at the information handling system, such as the maximumtemperature zone detected during a manufacturing activity. The stored thermal
parameter is read after the manufacturing activity and compared with an expected valueto determine the status of the thermal subsystem. For instance, an information handlingsystem maximum operating temperature is detected by firmware running on anembedded controller during imaging of a hard disk drive and fails thermal testing if thedetected maximum operating temperature exceeds a predetermined value, such as avalue that would not be reached if the thermal subsystem functioning properly.
申请人:Drew Schulke,Barry Kahr,Vinod Makhija,Adolfo Montero,Hasnain Shabbir
地址:Austin TX US,Austin TX US,Austin TX US,Austin TX US,Round Rock TX US
国籍:US,US,US,US,US
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